发明名称 Method to improve time domain sensitivity analysis performance
摘要 A method for performing sensitivity analysis on a circuit design is provided. The method initiates with identifying a partition of the circuit design. The method includes determining whether the partition belongs to a sensitivity graph, where the sensitivity graph represents a relationship between variables and parameters of the partition. If the partition belongs to the sensitivity graph, then the method includes, applying linear matrix factors to provide a solution to a system of linear equations and multiplying the solution by a vector to derive sensitivities for the circuit design.
申请公布号 US7484195(B1) 申请公布日期 2009.01.27
申请号 US20060468431 申请日期 2006.08.30
申请人 SUN MICROSYSTEMS, INC. 发明人 KOROBKOV ALEXANDER
分类号 G06F17/50;G06F17/16 主分类号 G06F17/50
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