发明名称 Insulated gate field effect transistor structure and use in logic gates.
摘要 <p>This structure comprises in an epitaxial layer 40 a P type diffused region 41 and zones 42 and 43 diffused within this region 41. A source electrode is integral with the epitaxially grown layer 40 and drain electrodes D1, D2 of the N+ type diffused zones 42 and 43. This gives a multidrain transistor. Furthermore, each drain may be associated with a plurality of gate electrodes G1, G2. Application to the construction of logic circuits in association with high tension bipolar structures. &lt;IMAGE&gt;</p>
申请公布号 EP0035453(A1) 申请公布日期 1981.09.09
申请号 EP19810400311 申请日期 1981.02.27
申请人 THOMSON-CSF 发明人 MOREAU, JEAN-MICHEL
分类号 H01L21/8222;H01L21/331;H01L21/8248;H01L27/06;H01L27/088;H01L29/08;H01L29/10;H01L29/73;H01L29/78;H03K19/0944;(IPC1-7):01L27/08;01L29/78;01L27/06;03K19/08 主分类号 H01L21/8222
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