发明名称 Surface property measuring device
摘要 A surface property measuring device comprises a detector having a stylus for measuring surface property and a skid at a leading end thereof, and a driving mechanism for causing the detector to advance and retreat along a surface to be measured. The measuring device further comprises a detector-lifting plate having an engaging portion engaging with a protrusion of a connector housing when the detector retreats to the utmost. The detecting-lifting plate is fixed to a frame of the driving mechanism, for lifting the leading end of the detector to thereby separate the skid and the stylus from the surface to be measured when the detector retreats. This enables the surface to be measured, a nose, the stylus, and the skid which protrude from the detector, to be protected when arranging the measurement and also removing the measuring device after the measurement.
申请公布号 US6164124(A) 申请公布日期 2000.12.26
申请号 US19980210933 申请日期 1998.12.15
申请人 MITUTOYO CORPORATION 发明人 FUJII, NOBUYOSHI;SHIRAI, TAMENORI
分类号 G01B21/20;G01B5/28;G01B7/34;G01B21/30;(IPC1-7):G01B5/28 主分类号 G01B21/20
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