发明名称 |
PLANATION METHOD OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A planarization method of a semiconductor device is provided to improve a local and a global planarization by using an HDPCVD(high density plasma CVD) without using a CMP(chemical mechanical polishing). CONSTITUTION: Line patterns having a first width and a second width are arranged on a semiconductor substrate. The second width of the line patterns is wider than the first width. The line patterns having the second width are to be subdivided into the line patterns having the first width. Then, a planarizing layer is formed on the substrate and the line patterns by using HDPCVD. The first width has 2.0 micrometer less than.
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申请公布号 |
KR100253311(B1) |
申请公布日期 |
2000.06.01 |
申请号 |
KR19970045517 |
申请日期 |
1997.09.02 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
PARK, JIN WON |
分类号 |
H01L21/3205;H01L21/302;H01L21/31;H01L21/316;H01L21/768;(IPC1-7):H01L21/302 |
主分类号 |
H01L21/3205 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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