发明名称 METHOD AND DEVICE FOR INSPECTING MAGNETIC CHARACTERISTICS, AND FIXTURES FOR CLEANING OR FOR INSPECTING CONTACT PROBE UNIT
摘要 PROBLEM TO BE SOLVED: To provide a method and a device for inspecting magnetic characteristics, capable of automating cleaning of a contact probe unit and improving the inspection reliability and the throughput of a magnetic head and a magnetic disk. SOLUTION: By having a cleaning dummy head assembly disposed and clamped on a head clamp base, in place of a magnetic head assembly and bring a contact probe unit into contact with a cleaning part, e.g., a cleaning sheet, without having manual work with the contact terminal of the contact probe unit, the contact probe unit is cleaned by contact operation. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009020974(A) 申请公布日期 2009.01.29
申请号 JP20070184205 申请日期 2007.07.13
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HIDA AKIRA;SUGIYAMA TOSHINORI;MIYAJIMA TORU
分类号 G11B5/455;G11B5/41 主分类号 G11B5/455
代理机构 代理人
主权项
地址
您可能感兴趣的专利