发明名称 Method for producing a wafer support, used, in particular, in a high-temperature CVD reactor or in a high-temperature CVD process which involves the use of aggressive gases
摘要 What is described here is a method of producing a wafer support having a protective layer, which, after the specifically mechanically prefabricated wafer support has been cleaned, is characterized by heating the cleaned wafer support to temperatures, by introducing coating components for conversion of the wafer support surface into the protective layer or for deposition of components supplied to a protective layer. The invention excels itself by the provisions that the inventive wafer support with the specific coating is suitable for a system for and a method of high-temperature CVD processing of wafers, operating on aggressive gases, in such a way that a chemical interaction with the wafer support will not occur, apart from the reproducible deposition of the desired succession of layers with a very good homogeneity of the material characteristics.
申请公布号 US2001014397(A1) 申请公布日期 2001.08.16
申请号 US20000752395 申请日期 2000.12.28
申请人 SCHMITZ DIETMAR;KAEPPELER JOHANNES;STRAUCH GERT;JURGENSEN HOLGER;HEUKEN MICHAEL 发明人 SCHMITZ DIETMAR;KAEPPELER JOHANNES;STRAUCH GERT;JURGENSEN HOLGER;HEUKEN MICHAEL
分类号 C30B25/12;C23C16/34;C23C16/458;H01L21/205;(IPC1-7):B32B9/00;B05C13/02;C23C16/32 主分类号 C30B25/12
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