发明名称 STATIC SEMICONDUCTOR MEMORY DEVICE AND ITS MANUFACTURE
摘要 PROBLEM TO BE SOLVED: To reduce an area of a memory cell of a static semiconductor memory device and simplify a wiring structure. SOLUTION: nMOS transistors Q1, Q2, Q5 and Q6, and pMOS transistor Q2 and Q4, are formed on a SOI layer. One impurity diffusion region of the transistors Q3 and Q4 are connected to another impurity region of the transistors Q1 and Q2. One end of a longitudinal direction of a polysilicon layer 2b1 is extended and connected to another impurity diffusion region of the transistor Q6. One end of a longitudinal direction of a polysilicon layer 2b2 is extended to the opposite direction and connected to another impurity diffusion region of the transistor Q5.
申请公布号 JPH1145949(A) 申请公布日期 1999.02.16
申请号 JP19970201363 申请日期 1997.07.28
申请人 MITSUBISHI ELECTRIC CORP 发明人 WADA TOMOHISA;KURIYAMA SACHITADA
分类号 H01L21/8244;H01L21/84;H01L27/11;H01L27/12;H01L29/786;(IPC1-7):H01L21/824 主分类号 H01L21/8244
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