| 摘要 |
A detector module 1 comprises a plurality of semiconductor devices 3, preferably CdTe, which are arranged so that alternate devices extend in opposite directions in the plane of the detector array, producing a central overlap region suitable for high resolution profiling when used in conjunction with a single slit 7 and two outer areas capable of lower resolution imaging. The velocity of a moving object may be determined using the two outer areas, where slits 6A, 6B allow two sections of the object to be imaged simultaneously. Further images may be taken after a given time interval and the two sets of images compared to determine the time taken for the object to move distance dz between the two locations. |
