| 摘要 |
A contact probe (20) for a tasting head is described, of the type wherein a plurality of these probes are inserted in guide holes realised in respective dies, the probe comprising a rod-shaped body (21) equipped at an end with at least a contact tip (22) effective to ensure the mechanical and electrical contact with a corresponding contact pad of an integrated electronic device to be tested. Advantageously, the rod-shaped body (21) has a non uniform cross section. Moreover, a testing head and a method for obtaining the contact probe according to the invention are described. |
