发明名称 Sample analyzing method and sample analyzing device
摘要 This invention relates to a technique for analyzing a sample. A sample analyzer ( 1 ) provided by the invention includes: a voltage applier ( 12 ) for applying a voltage to a reaction field which includes a sample; a response measurer ( 13 ) for measurement of a response to the voltage applied to the reaction field; a selector ( 11 ) for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample; an arithmetic operator ( 17 ) for calculation necessary for analyzing the sample based on the first response; a determiner ( 17 ) for determination, based on the second response, on whether or not the reaction field has been supplied with the target amount of sample; and a controller ( 15 ) which makes the selector select the second voltage application state after making the selector select the first voltage application state.
申请公布号 US2006224658(A1) 申请公布日期 2006.10.05
申请号 US20050522394 申请日期 2005.01.25
申请人 SATO YOSHIHARU;KATSUKI KOJI 发明人 SATO YOSHIHARU;KATSUKI KOJI
分类号 G06G7/00;G01N27/416;G01N33/487 主分类号 G06G7/00
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