发明名称 |
Sample analyzing method and sample analyzing device |
摘要 |
This invention relates to a technique for analyzing a sample. A sample analyzer ( 1 ) provided by the invention includes: a voltage applier ( 12 ) for applying a voltage to a reaction field which includes a sample; a response measurer ( 13 ) for measurement of a response to the voltage applied to the reaction field; a selector ( 11 ) for selecting a first voltage application state for measurement of a first response for use in calculation necessary for analyzing the sample or a second voltage application state for measurement of a second response for use in determining whether or not the reaction field has been supplied with a target amount of the sample; an arithmetic operator ( 17 ) for calculation necessary for analyzing the sample based on the first response; a determiner ( 17 ) for determination, based on the second response, on whether or not the reaction field has been supplied with the target amount of sample; and a controller ( 15 ) which makes the selector select the second voltage application state after making the selector select the first voltage application state.
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申请公布号 |
US2006224658(A1) |
申请公布日期 |
2006.10.05 |
申请号 |
US20050522394 |
申请日期 |
2005.01.25 |
申请人 |
SATO YOSHIHARU;KATSUKI KOJI |
发明人 |
SATO YOSHIHARU;KATSUKI KOJI |
分类号 |
G06G7/00;G01N27/416;G01N33/487 |
主分类号 |
G06G7/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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