发明名称 Probe card
摘要 A probe card includes a main substrate, a main reinforcing plate attached to the upper surface of the main substrate, a sub-reinforcing plate attached to the upper surface of the main reinforcing plate, and coupling force adjusting means that couples the main reinforcing plate with the sub-reinforcing plate and adjusts the coupling force therebetween. The coupling force adjusting means has a plurality of threaded holes provided at intersections of a plurality of imaginary concentric circles, which is provided with a distance from a center of a probe card on a surface of the sub-reinforcing plate, and a plurality of imaginary straight lines, which is provided radially from the center at an predetermined angle; a plurality of screw holes provided at same intersections on a surface of the main reinforcing plate; and a plurality of coupling screws threaded selectively into the threaded holes 23 a and the screw holes.
申请公布号 US7307435(B2) 申请公布日期 2007.12.11
申请号 US20050229843 申请日期 2005.09.20
申请人 NIHON DENSHIZAIRYO KABUSHIKI KAISHA 发明人 MORI CHIKAOMI
分类号 G01R31/02;G01R31/26;G01R1/04;G01R1/073;G01R31/28;H01L21/66 主分类号 G01R31/02
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