| 摘要 |
An ICT(In-Circuit Tester) using compensation of an internal resistance of a switch and a measurement method using the same are provided to enhance accuracy in a measuring process by compensating for the internal resistance of the switch. A switch matrix unit(230) selects a measuring element to be measured. A measurement unit(240) is connected to one end of the measuring element and includes a first, second, and third signal lines having switching elements in order to measure a DC current and a DC voltage. The first and second signal lines are connected to one end of the measurement unit. The third signal line is connected to the other end of the measurement unit. A control unit controls operations of the switch matrix unit and the measurement unit. A memory unit stores control orders and the measured result of the control unit. The measurement unit applies a DC constant voltage source or a DC constant current source through the first signal line in order to measure the current applied to the first signal line, the measurement element, and the third signal line. The control unit calculates a resistance of the measuring element and resistances of the switching elements by using the measured results. |
