发明名称 COMPENSATION METHOD AND SYSTEM OF DARK CURRENT IN DEVICE, AND OF WAVEFRONT ABERRATION IN LITHOGRAPHY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a compensation method of dark current for light energy value without affecting throughput of manufacturing system. SOLUTION: This compensation method comprises a step (a) of calculating a 1st dark current value from both 1st and 2nd arrays of a photosensitive device, a step (b) of receiving light energy through the 1st array, a step (c) of calculating light energy value for each element of the 1st array based on the received light energy, a step (d) of calculating a 2nd dark current value from the 2nd array insensitive to light energy at about the same time as the step (c), and a step (e) to adjust the light energy value as a function of both 1st and 2nd dark current values. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005049349(A) 申请公布日期 2005.02.24
申请号 JP20040216242 申请日期 2004.07.23
申请人 ASML HOLDING NV 发明人 SANDER WILLY M
分类号 G01J1/44;G01J1/02;G01J1/16;G01J1/42;G01J3/28;G03F7/20;H01L21/027;H04N5/335;H04N5/361;H04N5/369;(IPC1-7):G01J1/44 主分类号 G01J1/44
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