| 发明名称 | Methods for calculating and determining reference values for semiconductor memory cells | ||
| 摘要 | A method and associated apparatus to determine a reference value on the basis of a plurality of half reference values stored in memory cells is disclosed, wherein the plurality of half reference values are read from the memory cells, wherein a subset of half reference values is determined from the plurality of half reference values, and wherein the reference value is determined on the basis of the subset of half reference values. | ||
| 申请公布号 | US9520161(B2) | 申请公布日期 | 2016.12.13 |
| 申请号 | US201514834897 | 申请日期 | 2015.08.25 |
| 申请人 | Infineon Technologies AG | 发明人 | Kern Thomas;Goessel Michael;Hofmann Karl |
| 分类号 | G11C5/06;G11C11/56;G11C7/22;G11C7/14;G11C16/28 | 主分类号 | G11C5/06 |
| 代理机构 | Eschweiler & Associates, LLC | 代理人 | Eschweiler & Associates, LLC |
| 主权项 | 1. A method for determining a reference value on the basis of a plurality of half reference values stored in memory cells, wherein the plurality of half reference values are read from the memory cells, wherein a subset of read half reference values is determined from an evaluation of the plurality of read half reference values, wherein the subset of read half reference values comprises fewer than all of the half reference values, wherein the reference value is determined on the basis of the subset of half reference values. | ||
| 地址 | Neubiberg DE | ||