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发明名称
Memory testing apparatus
摘要
申请公布号
GB2317472(A)
申请公布日期
1998.03.25
申请号
GB19970019689
申请日期
1997.09.17
申请人
* ADVANTEST CORPORATION
发明人
KENICHI * FUJISAKI
分类号
G01R31/28;G01R31/3193;G11C29/00;G11C29/44;G11C29/56;(IPC1-7):G11C29/00
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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