发明名称 INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETERIC ANALYSIS METHOD
摘要 PROBLEM TO BE SOLVED: To provide an inductively-coupled plasma mass spectrometric analysis method, capable of accurately determinating a target element, even if the peak of molecular ions with which a coexisting substance or the coexisting substance and a gas component are coupled overlaps with the peak of the mass spectrum of the target element. SOLUTION: When the peak of molecular ions, with which the coexisting substrate or the coexisting substrate and the gas component are coupled, overlaps with the peak of the mass spectrum of the target element at the determination of the trace amount of a substance in a sample, correction intensity is calculated from the intensities of two arbitrarily selected overlapped peaks according formula: I'=iI-(iDB/jDB)jI (where I' is correction intensity; iI is the measured intensity of a mass number i; and iDB is the isotoptip ratio of the mass number i of interference ions) to determinate the target element.
申请公布号 JP2001324476(A) 申请公布日期 2001.11.22
申请号 JP20000141707 申请日期 2000.05.15
申请人 MURATA MFG CO LTD 发明人 OGIWARA TADAYUKI;HOMAE MASAHIRO;TAKASE YOSHIHIRO
分类号 G01N27/62;H01J49/26;(IPC1-7):G01N27/62 主分类号 G01N27/62
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