Method for testing integrated circuit and integrated circuit configured to facilitate performing such a method

摘要

An integrated circuit, such as for example an application specific integrated circuit, as well as a method of testing such a circuit, are disclosed herein. In one example embodiment, the integrated circuit includes a plurality of pins including a power pin, a ground pin, and a first communication pin, a test mode circuit, and a communication circuit. The integrated circuit additionally includes a first switch connected to the first communication pin, where the first switch is configured to couple the first communication pin to either the test mode circuit or the communication circuit. The integrated circuit further includes a control circuit coupled to the first switch and configured to control whether the first switch is operated to couple the first communication pin to the test mode circuit or to the communication circuit based upon or in response to an operating mode.

主权项

1. A method of testing an integrated circuit having a power pin, a ground pin, and a pair of communication pins, the method comprising:
receiving a test mode activation signal via at least one of the pair of communication pins; first setting a plurality of switches after receiving the test mode activation signal to couple the pair of communication pins to test circuitry; performing at least one test operation; and second setting the plurality of switches to couple the pair of communication pins to digital communication circuitry after the performing of the at least one test operation.