发明名称 3D LOCALIZATION MICROSCOPY, 4D LOCALIZATION MICROSCOPY, TRACKING METHODS AND TRACKING SYSTEMS
摘要 PROBLEM TO BE SOLVED: To provide an improved or at least alternative method of 3D localization microscopy.SOLUTION: A 3D localization microscopy system is configured to generate a phase difference between light traveling to or from one part of an objective lens and light traveling to or from another part of the objective lens in order to produce a point emitter image comprising two image lobes. In a position of an emitter, relative to the objective lens, that causes negative defocus, the two image lobes are separated from each other in first opposite directions substantially along an axis. In a position of the emitter, relative to the objective lens, that causes positive defocus, the two image lobes are separated from each other substantially along the axis in second opposite directions.SELECTED DRAWING: Figure 3
申请公布号 JP2016197260(A) 申请公布日期 2016.11.24
申请号 JP20160147913 申请日期 2016.07.28
申请人 CARL ZEISS MICROSCOPY GMBH 发明人 CHRISTIAN SOELLER;DAVID MICHAEL BADDELEY;MARK BRYDEN CANNELL
分类号 G02B21/00;G01N21/64;G06T1/00;G06T7/00 主分类号 G02B21/00
代理机构 代理人
主权项
地址