发明名称 METHOD OF MANUFACTURING PHOTOELECTRIC CONVERSION DEVICE
摘要 A method of manufacturing a photoelectric conversion device includes forming, with material containing aluminum, an electrically conductive pattern on a semiconductor substrate including a photoelectric converter, forming, on the electrically conductive pattern, an insulating film containing hydrogen, performing first annealing in a hydrogen-containing atmosphere, forming, on the insulating film, a protective film having lower hydrogen permeability than that of the insulating film after the first annealing, and performing second annealing in the hydrogen-containing atmosphere. Temperature in the first annealing is not less than temperature when forming the insulating film and not more than temperature when forming the protective film.
申请公布号 US2016329374(A1) 申请公布日期 2016.11.10
申请号 US201615139569 申请日期 2016.04.27
申请人 CANON KABUSHIKI KAISHA 发明人 Hara Koji;Ukigaya Nobutaka;Aoki Takeshi;Suzuki Yukinobu
分类号 H01L27/146 主分类号 H01L27/146
代理机构 代理人
主权项 1. A method of manufacturing a photoelectric conversion device, the method comprising: forming, with a material which contains aluminum, an electrically conductive pattern on a semiconductor substrate including a photoelectric converter; forming, on the electrically conductive pattern, an insulating film which contains hydrogen; performing, in a hydrogen-containing atmosphere, first annealing on a structure including the semiconductor substrate, the electrically conductive pattern, and the insulating film; forming, on the insulating film, a protective film having lower hydrogen permeability than that of the insulating film after the first annealing; and performing, in the hydrogen-containing atmosphere, second annealing on a structure including the semiconductor substrate, the electrically conductive pattern, the insulating film, and the protective film after formation of the protective film, wherein a temperature in the first annealing is not less than a temperature when forming the insulating film and not more than a temperature when forming the protective film.
地址 Tokyo JP