发明名称 |
CMOS IMAGE SENSOR AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A CMOS image sensor is provided to reduce the overlap capacitance produced between a floating diffusion area and a gate of a reset transistor, thereby suppressing the generation of noise. CONSTITUTION: The CMOS transistor comprises a first conducting semiconductor layer, a second conducting floating diffusion area formed under any surface of the semiconductor layer, a gate electrode of a reset transistor formed on the semiconductor layer adjacent to the floating diffusion area, and a gate insulated film positioned between the floating diffusion area and the gate of a reset transistor. The one edge of the gate electrode is overlapped with the floating diffusion area. A gate insulated film has relatively thicker than it of a gate oxide film positioned between a P-epi layer and the gate.
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申请公布号 |
KR20000010191(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980030953 |
申请日期 |
1998.07.30 |
申请人 |
HYUNDAI ELECTRONICS IND.CO.,LTD |
发明人 |
KIM, YONG NAM;SONG, TAEK KEUN |
分类号 |
H01L27/146;H01L29/84;(IPC1-7):H01L29/84 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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