发明名称 CMOS IMAGE SENSOR AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A CMOS image sensor is provided to reduce the overlap capacitance produced between a floating diffusion area and a gate of a reset transistor, thereby suppressing the generation of noise. CONSTITUTION: The CMOS transistor comprises a first conducting semiconductor layer, a second conducting floating diffusion area formed under any surface of the semiconductor layer, a gate electrode of a reset transistor formed on the semiconductor layer adjacent to the floating diffusion area, and a gate insulated film positioned between the floating diffusion area and the gate of a reset transistor. The one edge of the gate electrode is overlapped with the floating diffusion area. A gate insulated film has relatively thicker than it of a gate oxide film positioned between a P-epi layer and the gate.
申请公布号 KR20000010191(A) 申请公布日期 2000.02.15
申请号 KR19980030953 申请日期 1998.07.30
申请人 HYUNDAI ELECTRONICS IND.CO.,LTD 发明人 KIM, YONG NAM;SONG, TAEK KEUN
分类号 H01L27/146;H01L29/84;(IPC1-7):H01L29/84 主分类号 H01L27/146
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