发明名称 Optical inspection system, illumination apparatus and method for use in imaging specular objects based on illumination gradients
摘要 An optical inspection system uses an illumination gradient to gradually spatially vary the intensity and/or specular characteristics of the illumination reflected from the surface of a specular object to determine surface gradients of the object. The surface gradients can be used to reconstruct a three-dimensional image of the object. The illumination gradient can be produced by an illumination apparatus that includes circular arrays of light-emitting elements. The illumination gradient can also be produced using an optical element that gradually alters the illumination intensity of the reflected illumination in accordance with the incidence characteristics of the reflected illumination on the optical element. The illumination gradient enables the use of numerous illumination angles to reduce error in estimated surface gradients without increasing imaging or processing time.
申请公布号 US2004184653(A1) 申请公布日期 2004.09.23
申请号 US20030392758 申请日期 2003.03.20
申请人 BAER RICHARD L.;ZHANG XUEMEI;VOOK DIETRICH W. 发明人 BAER RICHARD L.;ZHANG XUEMEI;VOOK DIETRICH W.
分类号 G01B11/25;G01N21/88;G01N21/956;(IPC1-7):G06K9/00 主分类号 G01B11/25
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