发明名称 METHOD FOR FABRICATING RESIST PATTERN IN SEMICONDUTOR DEVICE
摘要 <p>PURPOSE: It supplies developer to the substrate in which the positive voltage is applied and the method for forming resist pattern of the semiconductor device eliminates the domain in which the exposure process operates. The resist film pattern which selectively exposes the same pattern object film is formed. CONSTITUTION: The pattern target film and resist film(220) are formed in the top of the substrate. The exposure process selectively operates in the chemical amplified resist film. The positive voltage is applied in the pattern target film above the light projecting board(200) in which the exposure process operates.</p>
申请公布号 KR20100101838(A) 申请公布日期 2010.09.20
申请号 KR20090020240 申请日期 2009.03.10
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUN, JUN
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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