发明名称 Methods and apparatus for process abatement
摘要 In a first aspect, a first abatement apparatus is provided. The first abatement apparatus includes (1) an oxidation unit adapted to receive an effluent stream from a semiconductor device manufacturing chamber; (2) a first water scrubber unit adapted to receive the effluent stream from the oxidation unit; and (3) a catalysis unit adapted to receive the effluent stream from the first water scrubber unit. Numerous other aspects are provided.
申请公布号 US2007086931(A1) 申请公布日期 2007.04.19
申请号 US20060452188 申请日期 2006.06.13
申请人 APPLIED MATERIALS, INC. 发明人 RAOUX SEBASTIEN;KINGSTON BRIAN;CURRY MARK;CLARK DANIEL;VERMEULEN ROBBERT;FLIPPO BELYNDA;HOLST MARK;TSU STEVE;LIN KEVIN;MCINTOSH MONIQUE
分类号 B01D53/34;B01D53/46;B01D53/86 主分类号 B01D53/34
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