发明名称 |
Semiconductor memory device improving threshold voltage of unselected memory block and operating method thereof |
摘要 |
The present invention relates to a semiconductor memory device and an operating method thereof. The semiconductor memory device may include at least two memory blocks sharing a row decoder, and a peripheral circuit performing a read operation on a selected memory block, between the at least two memory blocks, wherein the peripheral circuit applies a discharge voltage to an unselected memory block, between the at least two memory blocks, for a preset time after a period in which a read voltage is applied to the selected memory block is terminated. |
申请公布号 |
US9466372(B2) |
申请公布日期 |
2016.10.11 |
申请号 |
US201514697405 |
申请日期 |
2015.04.27 |
申请人 |
SK Hynix Inc. |
发明人 |
An Chi Wook |
分类号 |
G11C16/08;G11C16/04;G11C16/26 |
主分类号 |
G11C16/08 |
代理机构 |
IP & T Group LLP |
代理人 |
IP & T Group LLP |
主权项 |
1. A semiconductor memory device comprising:
at least two memory blocks suitable for sharing a row decoder; and a peripheral circuit suitable for performing a read operation on a selected memory block of the at least two memory blocks, wherein the peripheral circuit applies a discharge voltage to an unselected memory block of the at least two memory blocks for a preset time after a period in which a read voltage is applied to the selected memory block is terminated, and wherein the at least two memory blocks are coupled to different global word line groups in response to a block selection signal output from the row decoder. |
地址 |
Gyeonggi-do KR |