发明名称 Semiconductor memory device improving threshold voltage of unselected memory block and operating method thereof
摘要 The present invention relates to a semiconductor memory device and an operating method thereof. The semiconductor memory device may include at least two memory blocks sharing a row decoder, and a peripheral circuit performing a read operation on a selected memory block, between the at least two memory blocks, wherein the peripheral circuit applies a discharge voltage to an unselected memory block, between the at least two memory blocks, for a preset time after a period in which a read voltage is applied to the selected memory block is terminated.
申请公布号 US9466372(B2) 申请公布日期 2016.10.11
申请号 US201514697405 申请日期 2015.04.27
申请人 SK Hynix Inc. 发明人 An Chi Wook
分类号 G11C16/08;G11C16/04;G11C16/26 主分类号 G11C16/08
代理机构 IP & T Group LLP 代理人 IP & T Group LLP
主权项 1. A semiconductor memory device comprising: at least two memory blocks suitable for sharing a row decoder; and a peripheral circuit suitable for performing a read operation on a selected memory block of the at least two memory blocks, wherein the peripheral circuit applies a discharge voltage to an unselected memory block of the at least two memory blocks for a preset time after a period in which a read voltage is applied to the selected memory block is terminated, and wherein the at least two memory blocks are coupled to different global word line groups in response to a block selection signal output from the row decoder.
地址 Gyeonggi-do KR
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