| 发明名称 | Testing system for serial interface | ||
| 摘要 | A testing system includes a circuit board, and an inserting unit. The circuit board includes a first serial interface and a serial chip connected to the first serial interface. The first serial interface connects a second serial interface of a motherboard to receive a first signal of the second serial interface. The inserting unit includes a first plug connected to a pin Transmit Data of the first serial interface. The first plug connects a testing device. When the first signal is transmitted to the first serial interface by the second serial interface, the serial chip receives the first signal and sends the first signal back to the first serial interface. The first plug sends a second signal of the pin Transmit Data to the testing device to be tested. | ||
| 申请公布号 | US9360524(B2) | 申请公布日期 | 2016.06.07 |
| 申请号 | US201414305188 | 申请日期 | 2014.06.16 |
| 申请人 | ScienBiziP Consulting(Shenzhen)Co., Ltd. | 发明人 | Shu Shou-Li;Huang Wen-Min |
| 分类号 | G01R31/28;G01R31/319;G01R31/3187 | 主分类号 | G01R31/28 |
| 代理机构 | Novak Druce Connolly Bove + Quigg LLP | 代理人 | Novak Druce Connolly Bove + Quigg LLP |
| 主权项 | 1. A testing system comprising: a circuit board comprising a first serial interface and a serial chip connected to the first serial interface; the first serial interface is configured to connect a second serial interface of a motherboard to receive a first signal of the second serial interface; and an inserting unit comprising a first plug connected to a pin Transmit Data of the first serial interface; the first plug is configured to connect a testing device; wherein when the first signal is transmitted to the first serial interface by the second serial interface, the serial chip is configured to receive the first signal sent by the first serial interface and send the first signal back to the first serial interface, and the first plug is configured to send a second signal of the pin Transmit Data to the testing device to be tested. | ||
| 地址 | Shenzhen CN | ||