发明名称 SPECTRAL FEATURE METROLOGY OF A PULSED LIGHT BEAM
摘要 A metrology system includes an optical frequency separation apparatus in the path of the pulsed light beam and configured to interact with the pulsed light beam and output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; a plurality of sensing regions that receive and sense the output spatial components; and a control system connected to an output of each sensing region. The control system is configured to: measure, for each sensing region output; a property of the output spatial components from the optical frequency separation apparatus for one or more poises; analyze the measured properties including averaging the measured properties to calculate an estimate of the spectral feature of the pulsed light beam; and determine whether tire estimated spectral feature of the pulsed light beam is within an acceptable range of values of spectral features.
申请公布号 WO2016191114(A1) 申请公布日期 2016.12.01
申请号 WO2016US32214 申请日期 2016.05.12
申请人 CYMER, LLC (A NEVADA COMPANY) 发明人 THORNES, Joshua, Jon
分类号 G01J1/42;G01J3/28;G01J11/00;G03F7/20 主分类号 G01J1/42
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