发明名称 |
SPECTRAL FEATURE METROLOGY OF A PULSED LIGHT BEAM |
摘要 |
A metrology system includes an optical frequency separation apparatus in the path of the pulsed light beam and configured to interact with the pulsed light beam and output a plurality of spatial components that correspond to the spectral components of the pulsed light beam; a plurality of sensing regions that receive and sense the output spatial components; and a control system connected to an output of each sensing region. The control system is configured to: measure, for each sensing region output; a property of the output spatial components from the optical frequency separation apparatus for one or more poises; analyze the measured properties including averaging the measured properties to calculate an estimate of the spectral feature of the pulsed light beam; and determine whether tire estimated spectral feature of the pulsed light beam is within an acceptable range of values of spectral features. |
申请公布号 |
WO2016191114(A1) |
申请公布日期 |
2016.12.01 |
申请号 |
WO2016US32214 |
申请日期 |
2016.05.12 |
申请人 |
CYMER, LLC (A NEVADA COMPANY) |
发明人 |
THORNES, Joshua, Jon |
分类号 |
G01J1/42;G01J3/28;G01J11/00;G03F7/20 |
主分类号 |
G01J1/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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