发明名称 Resistive memory device, resistive memory system and method of operating the resistive memory device
摘要 A method of operating a resistive memory device and a resistive memory system including a resistive memory device is for a resistive memory device including a plurality of bit lines and at least one dummy bit line. The method of operating the resistive memory device includes detecting a first address accompanying a first command, generating a plurality of inhibit voltages for biasing non-selected lines, and providing to a first dummy bit line a first inhibit voltage selected from among the plurality of inhibit voltages based on a result of detecting the first address.
申请公布号 US9449686(B2) 申请公布日期 2016.09.20
申请号 US201514743488 申请日期 2015.06.18
申请人 Samsung Electronics Co., Ltd. 发明人 Kwon Hyo-Jin;Lee Yeong-Taek;Byeon Dae-Seok
分类号 G11C11/00;G11C13/00 主分类号 G11C11/00
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A method of operating a resistive memory device, wherein the resistive memory device comprises a plurality of bit lines and at least one dummy bit line, the method comprising: detecting a first address accompanying a first command related to a memory operation of the resistive memory device; generating a plurality of inhibit voltages for biasing non-selected lines from among the plurality of bit lines; and providing to a first dummy bit line from among the at least one dummy bit line a first inhibit voltage selected from among the plurality of inhibit voltages based on a result of detecting the first address.
地址 Suwon-si, Gyeonggi-do KR