发明名称 |
Resistive memory device, resistive memory system and method of operating the resistive memory device |
摘要 |
A method of operating a resistive memory device and a resistive memory system including a resistive memory device is for a resistive memory device including a plurality of bit lines and at least one dummy bit line. The method of operating the resistive memory device includes detecting a first address accompanying a first command, generating a plurality of inhibit voltages for biasing non-selected lines, and providing to a first dummy bit line a first inhibit voltage selected from among the plurality of inhibit voltages based on a result of detecting the first address. |
申请公布号 |
US9449686(B2) |
申请公布日期 |
2016.09.20 |
申请号 |
US201514743488 |
申请日期 |
2015.06.18 |
申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
Kwon Hyo-Jin;Lee Yeong-Taek;Byeon Dae-Seok |
分类号 |
G11C11/00;G11C13/00 |
主分类号 |
G11C11/00 |
代理机构 |
Volentine & Whitt, PLLC |
代理人 |
Volentine & Whitt, PLLC |
主权项 |
1. A method of operating a resistive memory device, wherein the resistive memory device comprises a plurality of bit lines and at least one dummy bit line, the method comprising:
detecting a first address accompanying a first command related to a memory operation of the resistive memory device; generating a plurality of inhibit voltages for biasing non-selected lines from among the plurality of bit lines; and providing to a first dummy bit line from among the at least one dummy bit line a first inhibit voltage selected from among the plurality of inhibit voltages based on a result of detecting the first address. |
地址 |
Suwon-si, Gyeonggi-do KR |