发明名称 EXPOSURE APPARATUS, METHOD FOR MANUFACTURING DEVICE, AND METHOD FOR CONTROLLING EXPOSURE APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure apparatus capable of excellently performing exposure processing, by suppressing influence on devices and members in a periphery of a substrate caused by leakage of liquid forming a liquid immersion area. <P>SOLUTION: An exposure apparatus exposes a substrate by projecting an image of a pattern on the substrate via a projection optical system and liquid. The exposure apparatus has a liquid supply mechanism which supplies the liquid between the projection optical system and the substrate. The liquid feeding mechanism stops supply of the liquid when abnormality is detected. <P>COPYRIGHT: (C)2012,JPO&INPIT
申请公布号 JP2012151493(A) 申请公布日期 2012.08.09
申请号 JP20120066139 申请日期 2012.03.22
申请人 NIKON CORP 发明人 UMAGOME NOBUTAKA;KOBAYASHI NAOYUKI;SAKAKIBARA YASUYUKI;TAKAIWA HIROAKI
分类号 H01L21/027;G03F7/20;H01L21/68 主分类号 H01L21/027
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