| 摘要 |
The application relates to a method for acquiring optical depth information of an optically scattering object (1) and comprises the following steps: irradiating measuring light onto the optically scattering object (1) by means of a light source (2), carrying out a movement of the object (1) relative to the light source (2) such that the measuring light detects at least a part of a surface of the object (1), detecting, by means of a flat optical measuring device (3), the light reflected by the surface of the object (1), analyzing position information of the reflected light to determine a surface quality of the object (1), measuring an intensity of the measuring light irradiated onto the surface of the object (1) while taking the surface quality of the object (1) into consideration, and analyzing an intensity of a pixel to acquire a depth information relating to the object, a position of the pixel being off-set from a position on the surface of the object onto which the measuring light is incident, and the previously measured intensity of the irradiated measuring light being taken into consideration for analyzing the intensity of the pixel. The application further relates to a device for acquiring optical depth information of an optically scattering object (1). |
