发明名称 |
Spectrometer with validation cell |
摘要 |
A valid state of an analytical system that includes a light source and a detector can be verified by determining that deviation of first light intensity data quantifying a first intensity of light received at the detector from the light source after the light has passed at least once through each of a reference gas in a validation cell and a zero gas from a stored data set does not exceed a pre-defined threshold deviation. The stored data set can represent at least one previous measurement collected during a previous instrument validation process performed on the analytical system. The reference gas can include a known amount of an analyte. A concentration of the analyte in a sample gas can be determined by correcting second light intensity data quantifying a second intensity of the light received at the detector after the light passes at least once through each of the reference gas in the validation cell and a sample gas containing an unknown concentration of the analyte compound. Related systems, methods, and articles of manufacture are also described.
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申请公布号 |
US8358417(B2) |
申请公布日期 |
2013.01.22 |
申请号 |
US201113026921 |
申请日期 |
2011.02.14 |
申请人 |
SPECTRASENSORS, INC.;FEITISCH ALFRED;KELLER LUTZ;LIU XIANG;SCHREMPEL MATHIAS;HELBLEY KEITH BENJAMIN |
发明人 |
FEITISCH ALFRED;KELLER LUTZ;LIU XIANG;SCHREMPEL MATHIAS;HELBLEY KEITH BENJAMIN |
分类号 |
G01J3/28;G01N21/00 |
主分类号 |
G01J3/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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