| 摘要 |
PROBLEM TO BE SOLVED: To provide a nondestructive inspection apparatus capable of exactly specifying a detection portion of a flaw or a reduced thickness area, easily carrying out a flaw inspection operation and precisely acquiring a flaw inspection waveform. SOLUTION: An operator has a flaw inspection probe 11 in his/her hand, and slides and scans it along the surface of an object to be inspected. A measuring device 12 measures a detection signal of the flaw inspection probe 11 being slid and scanned along the surface of the object to be inspected, and judges the flaw inspection probe 11 to be positioned on the detection portion of the flaw or the reduced thickness area of the object to be inspected, based on the detection signal of the flaw inspection probe 11. When the flaw inspection probe 11 is positioned on the detection portion of the flaw or the reduced thickness area of the object to be inspected, a stopping device 13 stops the sliding and scanning operation of the flaw inspection probe 11 in accordance with a stop command issued from the measuring device 12. COPYRIGHT: (C)2007,JPO&INPIT
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