发明名称 METHOD OF FORMING NANO-LAMINATE STRUCTURE DIELECTRIC FILM
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a high coverage smooth dielectric film having a high permittivity in relation to a method of manufacturing a capacitor dielectric film required, in accordance with the tendency for high capacitance of a semiconductor device. SOLUTION: A nano-laminate structure SrO/TiO film is formed on the lower electrode of the capacitor according to the molecular layer depositing method in the surface reaction rate determining state. The TiO film and the SrO film are respectively formed to have one or more molecular layers and twenty or less molecular layers, and are alternately and laminarly formed at a temperature≥150°C and≤400°C, respectively, and at a pressure of 10 Torr or more and equal to an atmospheric pressure or less. Consequently, a high permittivity and high coverage nano-laminate structure SrO film/TiO film can be obtained wherein a crystalline foreign material is not produced. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008028051(A) 申请公布日期 2008.02.07
申请号 JP20060197546 申请日期 2006.07.20
申请人 ELPIDA MEMORY INC 发明人 NAKANISHI SHIGEHIKO
分类号 H01L21/8242;H01L21/316;H01L27/108 主分类号 H01L21/8242
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