发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 Provided is a technique of forming a film on a substrate by performing a cycle a predetermined number of times. The cycle includes: forming a first layer by supplying a gas containing a first element to the substrate, wherein the first layer is a discontinuous layer, a continuous layer, or a layer in which at least one of the discontinuous layer or the continuous layer is overlapped; forming a second layer including the first layer and a discontinuous layer including a second element stacked on the first layer; and forming a third layer by supplying a gas containing a third element to the substrate to modify the second layer under a condition where a modifying reaction of the second layer by the gas containing the third element is not saturated.
申请公布号 US2016211132(A1) 申请公布日期 2016.07.21
申请号 US201615082145 申请日期 2016.03.28
申请人 Hitachi-Kokusai Electric Inc. 发明人 TAKASAWA Yushin;KARASAWA Hajime;HIROSE Yoshiro
分类号 H01L21/02 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor device, comprising: forming a film on a substrate, the film including a first element and a second element different from the first element, by performing a cycle a predetermined number of times, the cycle including: (a) forming a first layer that includes the first element by supplying a first gas that includes the first element to the substrate under a condition that an adsorption of the first element included in the first gas is not saturated; and (b) forming a second layer that includes the first element and the second element by supplying a second gas that includes the second element to the substrate to modify the first layer.
地址 Tokyo JP