发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
Provided is a technique of forming a film on a substrate by performing a cycle a predetermined number of times. The cycle includes: forming a first layer by supplying a gas containing a first element to the substrate, wherein the first layer is a discontinuous layer, a continuous layer, or a layer in which at least one of the discontinuous layer or the continuous layer is overlapped; forming a second layer including the first layer and a discontinuous layer including a second element stacked on the first layer; and forming a third layer by supplying a gas containing a third element to the substrate to modify the second layer under a condition where a modifying reaction of the second layer by the gas containing the third element is not saturated. |
申请公布号 |
US2016211132(A1) |
申请公布日期 |
2016.07.21 |
申请号 |
US201615082145 |
申请日期 |
2016.03.28 |
申请人 |
Hitachi-Kokusai Electric Inc. |
发明人 |
TAKASAWA Yushin;KARASAWA Hajime;HIROSE Yoshiro |
分类号 |
H01L21/02 |
主分类号 |
H01L21/02 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor device, comprising:
forming a film on a substrate, the film including a first element and a second element different from the first element, by performing a cycle a predetermined number of times, the cycle including: (a) forming a first layer that includes the first element by supplying a first gas that includes the first element to the substrate under a condition that an adsorption of the first element included in the first gas is not saturated; and (b) forming a second layer that includes the first element and the second element by supplying a second gas that includes the second element to the substrate to modify the first layer. |
地址 |
Tokyo JP |