发明名称 WAFER DRYING APPARATUS AND METHOD FOR DRYING A WAFER
摘要 A wafer drying apparatus includes air supply unit having first and second air supply tube provided at respective first and second front-surface side of wafer, and wafer holding unit configured to vertically hold wafer, and configured so that wafer relatively moves with respect to air supply unit, plurality of first air outlets separated from each other at predetermined intervals are provided at wafer side of first air supply tube, plurality of second air outlets separated from each other at predetermined intervals are provided at wafer side of second air supply tube, plurality of first and second air outlets are respectively provided to form an angle with respect to vertical direction regarding wafer as to blow air from peripheral portion to central portion with respect to central line in vertical direction of wafer. It is possible to provide wafer drying apparatus with simple structure, which reduces undried portion without degrading productivity.
申请公布号 US2016276180(A1) 申请公布日期 2016.09.22
申请号 US201415035982 申请日期 2014.11.19
申请人 SHIN-ETSU HANDOTAI CO., LTD. 发明人 YASUDA Taichi;ENOMOTO Tatsuo
分类号 H01L21/67 主分类号 H01L21/67
代理机构 代理人
主权项
地址 Tokyo JP
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