APPARATUS FOR CONTROLLING BANK OF SEMICONDUCTOR MEMORY

摘要

An apparatus for controlling a bank of a semiconductor memory is provided to reduce a maximum current generated in testing the semiconductor memory. A control signal generation unit(10) generates a control signal according to a test mode signal. A delay unit(20) receives an active signal and then delays the active signal for a constant time. A selection unit(30) outputs the active signal and an output signal of the delay unit selectively according to the level of the control signal. A bank control unit(40) controls a bank of a semiconductor memory by receiving an output signal of the selection unit.