发明名称 VENEER DEFECT DETECTOR AND CLIPPER CONTROL
摘要 Method of providing actuating signals to a cutting device having assymetrical actuation response characteristics in such a way that material is cut precisely at preselected locations includes manual or electronic means for generating cutting command signals, either as a result of a defect in the material or after predetermined lengths of material have moved through the cutting device, and means for introducing a time delay between the cutting command signals and those signals which actuate the cutting device. The magnitude of the time delay is determined by the speed at which the material moves through the cutting device and by the response characteristics of the cutting device to the actuating signals. If no defects are found in the material, the material will be cut automatically into predetermined standard lengths.
申请公布号 US3760667(A) 申请公布日期 1973.09.25
申请号 USD3760667 申请日期 1972.08.03
申请人 BLACK CLAWSON CO,US 发明人 MAXEY C,US;MONTAGUE G,US;LEYDE W,US;BRYAN E,US
分类号 B23D36/00;B27L5/08;(IPC1-7):B26D5/38 主分类号 B23D36/00
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