发明名称 Semiconductor memory device.
摘要 <p>]A semiconductor device having a semiconductor substrate (41), wherein first and second insulating gate FET transistor (Q1, Q2) respectively connected in series with first and second polycrystalline silicon layers (R1, R2) acting as loads of first and second inverters are formed, the first polycrystalline silicon layer (R1) is provided above a gate electrode of the second insulation gate FET transistor (Q2), and the second polycrystalline silicon layer (R2) is provided above a gate electrode of the first insulation gate FET transistor (Q1).</p>
申请公布号 EP0029099(A2) 申请公布日期 1981.05.27
申请号 EP19800105584 申请日期 1980.09.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 ARIIZUMI, SHOJI;SEGAWA, MAKOTO
分类号 G11C11/412;G11C11/418;H01L21/02;H01L21/764;H01L23/528;H01L27/06;H01L27/11;(IPC1-7):11C11/40;01L29/04;01L27/10 主分类号 G11C11/412
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