发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PURPOSE:To assure the rapid actuation by a method wherein the overall exposed surface on source.drain regions is brought into electrical contact with electrode wiring films. CONSTITUTION:An MOS transistor is structured by source.drain and electrodes in direct contact with each other without making so called contact holes. The gap between the ends of contact surfaces between thick source.drain regions 7 and titanium silicide films 12 and the channel ends being decided by the width of residual oxide films 11, i.e. the thickness of sidewalls, the applicable gap shall be as little as possible within the range of normal actuation of device. Resultantly, the source resistance and the drain resistance are minimized if other factors are constant Through these procedures, the rapid actuation of device can be assured.
申请公布号 JPS63175476(A) 申请公布日期 1988.07.19
申请号 JP19870007809 申请日期 1987.01.14
申请人 NEC CORP 发明人 MATSUMOTO HIROSHI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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