发明名称 REDUNDANCY SYSTEM FOR SEMICONDUCTOR DEVICE
摘要 PURPOSE:To make the distance between a fault bit and normal bit larger by relieving the adjacent bit line pairs of the bit line pair in which the faulty bit occurs. CONSTITUTION:When a faulty point A occurs in a bit line pair B and the inverse of B connected with a sense amplifier, the adjacent bit line pairs B and the inverse of B on both sides of the faulty bit line pairs B and the inverse of B in which the faulty point A occurs are relived together with the faulty bit line pairs B and the inverse of B. Therefore, the distances between the faulty bit line B and the inverse of B and normal bit line pairs B and the inverse of B become larger and adverse influences from the faulty bit line pair B and the inverse of B to the normal bit line pairs B and the inverse of B can be reduced.
申请公布号 JPH0223599(A) 申请公布日期 1990.01.25
申请号 JP19880174010 申请日期 1988.07.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 ADACHI YUKINOBU;MIYATAKE HIDEJI
分类号 G11C11/413;G11C11/34;G11C29/00;G11C29/04 主分类号 G11C11/413
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