发明名称 |
REDUNDANCY SYSTEM FOR SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE:To make the distance between a fault bit and normal bit larger by relieving the adjacent bit line pairs of the bit line pair in which the faulty bit occurs. CONSTITUTION:When a faulty point A occurs in a bit line pair B and the inverse of B connected with a sense amplifier, the adjacent bit line pairs B and the inverse of B on both sides of the faulty bit line pairs B and the inverse of B in which the faulty point A occurs are relived together with the faulty bit line pairs B and the inverse of B. Therefore, the distances between the faulty bit line B and the inverse of B and normal bit line pairs B and the inverse of B become larger and adverse influences from the faulty bit line pair B and the inverse of B to the normal bit line pairs B and the inverse of B can be reduced.
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申请公布号 |
JPH0223599(A) |
申请公布日期 |
1990.01.25 |
申请号 |
JP19880174010 |
申请日期 |
1988.07.12 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
ADACHI YUKINOBU;MIYATAKE HIDEJI |
分类号 |
G11C11/413;G11C11/34;G11C29/00;G11C29/04 |
主分类号 |
G11C11/413 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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