Zero insertion pressure test socket for pin grid array electronic packages

摘要

A zero-insertion-pressure, pin-grid-array test socket is provided which includes a novel toggle mechanism for opening an array of contacts within the socket to accept a component for testing and closing the contacts after insertion of the component. The toggle mechanism comprises two links and a hinge pin disposed between and connecting the links. A handle is connected to one of the links and the hinge pin and movement of the handle causes separation of the links which in turn causes movement of a plate resulting in the opening or closing of the array of contacts.