发明名称 SEMICONDUCTOR DEVICE WITH DAMASCENE GATE STRUCTURE AND FABRICATING METHOD THEREOF
摘要 PURPOSE: A semiconductor device with a damascene gate structure is provided to prevent a short channel effect by making a source contact and a drain contact composed of a conductive layer on a semiconductor substrate and by disposing the source and drain contacts at both sides of a gate electrode. CONSTITUTION: A semiconductor substrate(11) is prepared. Source and drain contacts(23s,23d) are sequentially disposed on the semiconductor substrate. A wordline(33) crosses the semiconductor substrate, interposed between the source and drain contacts. An insulation layer pattern(25) is interposed between the source and drain contacts and between the drain contact and the wordline. A gate oxide layer(28c) is interposed between the wordline and the semiconductor substrate.
申请公布号 KR20040038433(A) 申请公布日期 2004.05.08
申请号 KR20020067372 申请日期 2002.11.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JEONG DONG;CHOI, SI YEONG;KIM, CHEOL SEONG;KIM, SEONG MIN;LEE, BYEONG CHAN;PARK, DONG GEON
分类号 H01L21/336;(IPC1-7):H01L21/336 主分类号 H01L21/336
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