发明名称 X-ray micro-tomography system optimized for high resolution, throughput, image quality
摘要 A projection x-ray imaging system that possibly utilizes a laboratory-based micro-focused x-ray source is disclosed. Techniques for optimizing the system for high quality, three dimensional image formation with tomographic imaging with the potential for high resolution and high throughput are described. It also concerns ways to optimize the system design to obtain improved image quality.
申请公布号 US7388942(B2) 申请公布日期 2008.06.17
申请号 US20070682503 申请日期 2007.03.06
申请人 XRADIA, INC. 发明人 WANG YUXIN;YUN WENBING;SCOTT DAVID DEAN
分类号 A61B6/03 主分类号 A61B6/03
代理机构 代理人
主权项
地址