发明名称 INTEGRATED CIRCUIT PACKAGE HAVING WIREBONDED MULTI-DIE STACK
摘要 Embodiments of the present disclosure are directed towards an integrated circuit (IC) package including a first die at least partially embedded in a first encapsulation layer and a second die at least partially embedded in a second encapsulation layer. The first die may have a first plurality of die-level interconnect structures disposed at a first side of the first encapsulation layer. The IC package may also include a plurality of electrical routing features at least partially embedded in the first encapsulation layer and configured to route electrical signals between a first and second side of the first encapsulation layer. The second side may be disposed opposite to the first side. The second die may have a second plurality of die-level interconnect structures that may be electrically coupled with at least a subset of the plurality of electrical routing features by bonding wires.
申请公布号 US2016276311(A1) 申请公布日期 2016.09.22
申请号 US201414768209 申请日期 2014.08.26
申请人 INTEL CORPORATION 发明人 Meyer Thorsten;Jaervinen Pauli;Patten Richard
分类号 H01L25/065;H01L23/528;H01L25/00;H01L23/48;H01L21/56;H01L23/31;H01L23/00 主分类号 H01L25/065
代理机构 代理人
主权项 1. An integrated circuit (IC) package comprising: a first die at least partially embedded in a first encapsulation layer, the first die having a first plurality of die-level interconnect structures that are disposed at a first side of the first encapsulation layer; a plurality of electrical routing features at least partially embedded in the first encapsulation layer and configured to route electrical signals between the first side of the first encapsulation layer and a second side of the first encapsulation layer that is disposed opposite to the first side; and a second die disposed on the second side of the first encapsulation layer and at least partially embedded in a second encapsulation layer, the second die having a second plurality of die-level interconnect structures, wherein the second plurality of die-level interconnect structures are electrically coupled with at least a subset of the plurality of electrical routing features by bonding wires.
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