| 摘要 |
<p>PROBLEM TO BE SOLVED: To improve the production efficiency of a liquid crystal display device by enabling the specification of the point where a shorting defect across plural source wirings occurs. SOLUTION: Probe pins for resistance measurement are respectively in contact with two source signal wiring ends which are formed independently from each other. The resistance value between the source signal wirings is then measured. At this time, the resistance of the one source signal wiring is defined as (R0 ) and the resistances from the source signal wiring ends to the defects of the shorted two source signal wirings are defined respectively as R1 , R2 , the length of the one source signal wiring is defined as L0 , the length from the source signal wiring ends to the defects as x, the resistance of the shorting part as (r) and the resistance between the shorted source signal wirings as r0 . Since the lengths to the defects of the shorted two source signal wirings are equal, x=(R1 /R0 )×L0 =(r0 /2R0 )×L0 is obtd.</p> |
