发明名称 SEMICONDUCTOR DEVICE WITH TELERANCE TO PATTERN DISPLACEMENT
摘要 A semiconductor device includes first and second transistors to be arranged a point symmetry with respect to a point and having first and second gates and first and second channel regions, respectively. The first and second gates are formed based on first and second gate electrode patterns to be arranged a point symmetry with respect to the point, respectively. Each of the first and second gate electrode patterns includes first and second serif sections and an electrode section between the first and second serif sections.
申请公布号 US2002038899(A1) 申请公布日期 2002.04.04
申请号 US19990418555 申请日期 1999.10.14
申请人 YAMAGUCHI SATOSHI 发明人 YAMAGUCHI SATOSHI
分类号 H01L21/8234;H01L21/768;H01L21/8244;H01L27/088;H01L27/11;(IPC1-7):H01L21/336;H01L29/76;H01L31/062;H01L21/476 主分类号 H01L21/8234
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