| 摘要 |
FIELD: X-ray diffraction and X-ray topography methods for studying the structure and quality control of materials during nondestructive testing. ^ SUBSTANCE: the invention is intended for X-ray beam shaping, in particular, the synchrotron radiation beam, by means of crystals-monochromators. The device for X-ray beam shaping has two crystals-monochromators in the dispersionless diffraction scheme. It is ensured by the possibility of displacement of one from crystals in the direction of the primary beam with crystal fixing in two discrete positions. Both crystals-monochromators have the possibility of rotation for realization of the successive Bragg diffraction. Device for crystal bending has displacement mechanism, two immovable and two movable cylindrical rods, between of which the end parts of a bent crystal are located. The axes of these parts are displaced one in respect to the other. The immovable rods are leaned against the upper surface of a flat parallel plate near its end faces. The L-shaped brackets are attached to the end faces of plate. The parallel surfaces of the brackets contact with immovable rods. The parallel surfaces of the end faces of the upper joints of L-shaped brackets contact with movable rods. The plate with L-shaped brackets is embraced with crooked shoulders of floating rocker with cylindrical pins, installed on the rocker ends. The pins are leaned against the surfaces of movable rods perpendicularly to them. The displacement mechanism is located between the lower surface of plate and middle point of the rocker. ^ EFFECT: increasing the energy range of X-ray beam when maintaining its spatial position; improving the uniformity of bending force distribution and homogeneity of crystal deformation. ^ 2 cl, 2 dwg |
