发明名称 Substrate processing apparatus capable of forming films including at least two different elements
摘要 Provided is a technique of forming a film on a substrate by performing a cycle a predetermined number of times. The cycle includes: forming a first layer by supplying a gas containing a first element to the substrate, wherein the first layer is a discontinuous layer, a continuous layer, or a layer in which at least one of the discontinuous layer or the continuous layer is overlapped; forming a second layer including the first layer and a discontinuous layer including a second element stacked on the first layer; and forming a third layer by supplying a gas containing a third element to the substrate to modify the second layer under a condition where a modifying reaction of the second layer by the gas containing the third element is not saturated.
申请公布号 US9487861(B2) 申请公布日期 2016.11.08
申请号 US201615182722 申请日期 2016.06.15
申请人 Hitachi Kokusai Electric Inc. 发明人 Takasawa Yushin;Karasawa Hajime;Hirose Yoshiro
分类号 C23C16/455;C23C16/46;C23C16/52;H01L21/02 主分类号 C23C16/455
代理机构 Brundidge & Stanger, P.C. 代理人 Brundidge & Stanger, P.C.
主权项 1. A substrate processing apparatus comprising: a process vessel configured to accommodate a substrate; a first gas supply system configured to supply a first gas that includes a first element into the process vessel; a second gas supply system configured to supply a second gas that includes a second element different from the first element into the process vessel; a heater configured to heat the substrate accommodated in the process vessel; a pressure adjustment unit configured to adjust an inside pressure of the process vessel; and a controller configured to control the first gas supply system, the second gas supply system, the heater, and the pressure adjustment unit to form a film on the substrate, the film including the first element and the second element, by performing a cycle a predetermined number of times, the cycle including: (a) forming a first layer that includes the first element by supplying the first gas to the substrate in the process vessel, and(b) forming a second layer that includes the first element and the second element by supplying the second gas to the substrate in the process vessel to modify the first layer; wherein pressure in the process vessel in one process of (a) and (b) is controlled to be higher than pressure in the process vessel in the one process when the film having a stoichiometric composition is formed, or pressure in the process vessel in an other process of (a) and (b) is controlled to be lower than pressure in the process vessel in the other process when the film having the stoichiometric composition is formed, so as to form the film having a composition where one of the first and second elements is excessive as compared with an other one of the first and second elements in terms of the stoichiometric composition, and wherein the first layer includes a discontinuous layer.
地址 Tokyo JP