发明名称 MANUFACTURE OF SCHOTTKY BARRIER DIODE
摘要 PROBLEM TO BE SOLVED: To enable lowering of the normal directional voltage VF, without increasing the reverse directional current IR. SOLUTION: A first N type epitaxial layer 2a is formed on an N<++> type silicon substrate 1, and then phosphorus is evaporated and diffused on the central surface part of the first epitaxial layer 2a to form an N<+> type heavily doped region 3, successively forming a second N type epitaxial layer 2b on the first epitaxial layer 2a including the heavily doped region 3. Later, a P type guard ring layer is formed for the formation of a Schottky metal so as to joint with the second epitaxial layer 2b.
申请公布号 JPH11214711(A) 申请公布日期 1999.08.06
申请号 JP19980016680 申请日期 1998.01.29
申请人 MATSUSHITA ELECTRON CORP 发明人 ISHIHARA KENJI
分类号 H01L29/872;H01L29/47;(IPC1-7):H01L29/872 主分类号 H01L29/872
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