发明名称 BONDING PAD AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To remove particles stuck to the tip of a probe needle, and also to suppress electrical continuity failure. SOLUTION: A polysilicon layer 6 connected to a gate electrode is formed on a silicon substrate 7, an interlayer insulating film 5 is formed thereupon, and further the bonding pad where a metal layer 2, 3, 4, having a three-layer structure, is contacted directly and laminated, is formed thereupon. By forming an opening 22 through the third metal layer 2 and a barrier metal layer 1, 1 above and below the metal layer, the convexoconcave surface is formed on this bonding pad surface.
申请公布号 JP2002110730(A) 申请公布日期 2002.04.12
申请号 JP20000293503 申请日期 2000.09.27
申请人 RICOH CO LTD 发明人 IKURA MOTOKO
分类号 H01L21/66;H01L21/60;(IPC1-7):H01L21/60 主分类号 H01L21/66
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