| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic component inspecting equipment and its wiring structure in which the time or labor required for preparing inspection can be reduced. SOLUTION: The electronic component inspecting equipment 1 characterized by having a probe section 2 comprising probe lines 101r-228b connected with respective probe terminals and extending substantially in parallel with each other, a first lead line 205a linking the probe lines 101r-228r, a second lead line 206a linking the probe lines 101r-228g, and a third lead line 207a linking the probe lines 101b-228; is adopted. COPYRIGHT: (C)2004,JPO
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